LAAN-A-FT-E070A Application News Spectrophotometric Analysis Contaminant Analysis Using EDXIR-Analysis Software for Combined EDX-FTIR Analysis A522A No. When contaminants are generated, it is important to quickly identify them, ascertain the source, and take measures against further occurrence. Energy dispersive X-ray spectroscopy…
Klíčová slova
edx, hit, ftir, edxir, data, contaminant, analysis, luster, kev, library, database, cps, metallic, atr, sample