Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Aplikace | 2015 | Agilent TechnologiesInstrumentace
ICP/MS, ICP/MS/MS
Zaměření
Polovodiče
Výrobce
Agilent Technologies
PDF verze ke stažení a čtení
 

Podobná PDF

Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
Measuring Inorganic Impurities in Semiconductor Manufacturing
Agilent ICP-MS Journal (March 2012 – Issue 49)
Agilent ICP-MS Journal (March 2012 – Issue 49)
2012|Agilent Technologies|Ostatní
Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900