Measuring Multiple Elements in Nanoparticles using spICP-MS

Michiko Yamanaka1*, Takayuki Itagaki1, Steve Wilbur2 Nanoparticle Analysis in Cosmetic Samples by Multi-element Screening Function of spICP-MS 1. Agilent Technologies International Japan, Ltd 2. Agilent Technologies Inc. 2018 Winter Conference TP14 Results and Discussion • spICP-MS (single particle ICP-MS) is…

Measurement of nanoparticle components in sunscreens by multi-element screening function of spICP-MS Michiko Yamanaka1*, Takayuki Itagaki1, Steve Wilbur2 APWC2017 1. Agilent Technologies International Japan, Ltd C-02 2. Agilent Technologies Inc. Results and Discussion Time (s) Sunscreen B Time (s) Count…

Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…

Accurate Determination of TiO2 Nanoparticles in Complex Matrices using the Agilent 8900 ICP-QQQ Application note Authors Environmental, food, cosmetics, materials Michiko Yamanaka Agilent Technologies, Japan Steve Wilbur Agilent Technologies, USA Introduction Titanium dioxide (TiO2) nanoparticles (NPs) are widely used in…