Application Note: 51735 Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy Tim Deschaines, Joe Hodkiewicz, Pat Henson, Thermo Fisher Scientific, Madison, WI, USA Abstract Key Words • DXR Raman Microscope • Amorphous and Crystalline Silicon • Chemical Imaging •…
Klíčová slova
raman, silicon, amorphous, crystalline, laser, dxr, atlµs, spectroscopy, power, microscope, distribution, mapping, microcrystalline, excitation, forms