Aplikace se zaměřením na ICP/MS/MS od Agilent Technologies - strana 7
Otevřít dokument Agilent 8800 ICP-QQQ Upgrades
ICPMS
Agilent 8800 ICP-QQQ Upgrades
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Otevřít dokument Automated Multielement Analysis of Single Cells and Microplastics by ICP-MS with Micro-Flow Sampling
ICPMS
Automated Multielement Analysis of Single Cells and Microplastics by ICP-MS with Micro-Flow Sampling
Příprava vzorků, ICP/MS, ICP/MS/MS
Instrumentace
Příprava vzorků, ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies, Elemental Scientific
Zaměření
Životní prostředí
Otevřít dokument Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
ICPMS
Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS
ICPMS
Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Single Cell and Microplastic Analysis by ICP-MS with Automated Micro- Flow Sample Introduction
ICPMS
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro- Flow Sample Introduction
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Životní prostředí, Klinická analýza
Otevřít dokument Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS
ICPMS
Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS
ICP/MS, ICP/MS/MS, Laserová ablace
Instrumentace
ICP/MS, ICP/MS/MS, Laserová ablace
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Agilent ICP-MS Journal (May 2023, Issue 92)
ICPMS
Agilent ICP-MS Journal (May 2023, Issue 92)
ICP/MS, ICP/MS/MS, Laserová ablace
Instrumentace
ICP/MS, ICP/MS/MS, Laserová ablace
Výrobce
Agilent Technologies
Zaměření
Otevřít dokument WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
ICPMS
WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Životní prostředí, Materiálová analýza
Otevřít dokument WCPS: Direct Metal Analysis by New Galvano-Mirror fs-LA-ICP-MS using 100%-Normalization Method with NIST 612 Glass CRM as Calibration Standard
ICPMS
WCPS: Direct Metal Analysis by New Galvano-Mirror fs-LA-ICP-MS using 100%-Normalization Method with NIST 612 Glass CRM as Calibration Standard
ICP/MS, ICP/MS/MS, Laserová ablace
Instrumentace
ICP/MS, ICP/MS/MS, Laserová ablace
Výrobce
Agilent Technologies
Zaměření
Otevřít dokument WCPS: Single-Cell and Bulk ICP-MS Investigation of Accumulation Patterns of Pt-based Drugs in Cisplatin–Sensitive and –Resistant Cell Models
ICPMS
WCPS: Single-Cell and Bulk ICP-MS Investigation of Accumulation Patterns of Pt-based Drugs in Cisplatin–Sensitive and –Resistant Cell Models
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Farmaceutická analýza, Klinická analýza
