Aplikace z oblasti Polovodiče - strana 9
Otevřít dokument Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP TQs ICP-MS
ICPMS
Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific, Teledyne LABS
Zaměření
Polovodiče
Otevřít dokument Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS
ICPMS
Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Zaměření
Polovodiče
Otevřít dokument Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS
ICPMS
Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS
ICPMS
Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Thermo Scientific ICP-MS solutions for the semiconductor industry
ICPMS
Thermo Scientific ICP-MS solutions for the semiconductor industry
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Thermo Fisher Scientific
Zaměření
Polovodiče
Otevřít dokument Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
ICPMS
Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
ICPMS
Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
ICPMS
Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Průmysl a chemie, Polovodiče
Otevřít dokument Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
ICPMS
Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
Otevřít dokument Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
ICPMS
Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
ICP/MS, ICP/MS/MS
Instrumentace
ICP/MS, ICP/MS/MS
Výrobce
Agilent Technologies
Zaměření
Polovodiče
